ANSI EIA 364 25E pdf free download

ANSI EIA 364 25E pdf free download.Probe Damage Test Procedure for Electrical Connectors.
3.2 Preparation
3.2.1 Crimp or other removable contacts shall use a suitable collet type holding device, as shown in figure 2, unless otherwise specified in the referencing document. Non-removable socket contacts shall be tested in their connector housing, as shown in figure 3.
3.2.2 The colict type holding device shall not support the contact in any way that interferes with the free rotation of the test probe fixture. The collet device shall grip the contact on the contact crimp barrel, or the termination end of the contact (e.g. wrap-type terminations, solder-tail, compliant pin, etc.) with the contact shoulder flush against the collet device. The collet shall not interfere with the socket spring member under test.
4 Test procedure
4.1 The connector or the collet device with the socket contacts fixed in place shall be mounted in
a horizontal position to a rotating fixture to allow 3600 hand rotation during test; see figures 2 and
3.
4.2 The probe damage tool, see figure 1, shall be inserted into the contact to a “B” dimension depth as illustrated in figure 1. The “B” dimension shall be both 1/2 and 3/4 of socket bore minimum depth specified in the referencing document. The amount the socket contact is recessed from the front of the housing shall be added to probe length “B” when a connector holding device is used. Unless otherwise specified in the referencing document the tolerance on the “B” dimension shall be minus 0 millimeter (0 inch) plus 0.127 millimeter (0.005 inch).
4.3 When the test setup is in conformance with 4.1 and 4.2 the fixture shall be slowly rotated once through 3600 at a uniform rate of no less than a 5 second rotation and no more than a 15 second rotation, unless otherwise specified in the referencing document, with the probe damage tool inserted in the contact so that the force is applied uniformly to the inside diameter of the socket. The test shall be repeated so that both insertion depths (i.e., 1/2 and 3/4) are tested.
5 Details to be specified
The following details shall be specified in the referencing document:
5.1 Initial and final examination or measurement
5.2 Mounting of specimen, see clause 4. The collet device shall be defined in the referencing document
5.3 Number and size of samples to be tested
5.4 Probe depth dimension
5.5 Number of 360° rotations indicated in 4.3 if other than one
6 Test documentation Documentation shall contain the details specified in clause 5, with any exceptions, and the following: 6.1 Title of test 6.2 Sample description, including fixturing 6.3 Test equipment used, and date of last and next calibration 6.4 Test procedure 6.5 Values and observations 6.6 Name of operator and start/finish date(s) of testANSI EIA 364 25E  pdf download.