ANSI EIA 364 87B pdf free download

ANSI EIA 364 87B pdf free download.Nanosecond Event Detection Test Procedure for Electrical Connectors, Contacts and Sockets.
3.1.3.2.1 EMI couples to the specimen through the parasitic capacitance between the specimen and any metal fixturing. An optional strategy to greatly reduce this coupling, and thereby reduce the risk of false trips due to EM!, is to connect the miniature coaxial cable shield to the metal fixturing. This optional connection is most effective if the connection is as short as possible and is perpendicular to nearby specimen conductors; see figure 2, note D. This optional connection is applicable to the specimen channel(s) only, not the control channel(s) with the EM! loop(s).
NOTE If there is no metal fixturing within 5 cm of the specimen circuit, EMI coupling to the specimen through parasitic capacitance is not expected to be significant, so the optional connection of the miniature coaxial cable shield to the metal fixturing is not expected to be beneficial in reducing incidence of false trips due to EM!.
3.1.3.2.2 Large EMI currents in adjacent contacts can couple through crosstalk or capacitance to monitored channels. To reduce this, no conductor of any type may be connected to contacts not being monitored for an event. It is recommended that monitored contacts be evenly distributed around the connector to minimize crosstalk with other monitored channels; see figure 2, note B.
3.1.3.2.3 The loop area of the specimen circuits shall be minimized to reduce magnetic field coupling.
3.1.3.3 Control channel(s)
Anytime a failure is indicated, it is possible that the real cause was actually electromagnetic interference (EM!), and not the connector-under-test. The goal of the control channel(s) is to detect EM! at levels much lower than required to trigger an event on a specimen channel. During testing, the control channels shall be monitored with the same detector values as used on the specimen circuits. An event observed on a control channel invalidates any other events detected during the polling period, see 3.1.4.6 to define polling period.
3.1.3.3.1 Ten and fifty nanoseconds event detection
3.1.3.3.1.1 A control channel shall consist of a separate ioop of wire with an area of one square meter suspended above the specimen(s) and monitored through a miniature coaxial cable attached at the top center of the loop; see figure 4, note A.
3.1.3.3.1.2 Select a typical specimen series wired circuit that can be dedicated to an EM! control channel. Instead of connecting this specimen circuit directly to a miniature coaxial cable, connect it to the center of the control channel EMI ioop, opposite the coaxial cable connection; see figure 4, note B. A separate specimen may be required if specimen has only one contact.
3.1.3.3.2 One nanosecond event detection
3.1.3.3.2.1 Three control channels shall be provided, consisting of 3 nested, mutually perpendicular loops, see figure 5. Each ioop shall have a nominal area of 36 square cm (e.g., 6cm x 6 cm). These loops shall be suspended over the specimen(s).
3.1.3.3.2.2 Select a typical specimen series wired circuit that can be dedicated to EM! control channels. Instead of connecting this specimen circuit directly to a miniature coaxial cable, connect it to the center of one of the control channel EM! loops, opposite the coaxial cable connection; see figure 5. A separate specimen may be required if specimen has only one contact.
3.1.3.3.2.3 Optionally, for enhanced false-trip detection during one-nanosecond detection, a second typical specimen series circuit may be dedicated to an additional control channel that is configured as described in 3.1.3.3.1 and depicted in Figure 4. This additional control channel configuration is the same as that used for 10 and 50 nanosecond event detection. The additional control channel would supplement the required three control channels described in 3.1.3.3.2.1 and depicted in Figure 5; it would not replace them.
ANSI EIA 364 87B pdf download.